no code implementations • 25 Nov 2023 • Tapan Ganatma Nakkina, Adithyaa Karthikeyan, Yuhao Zhong, Ceyhun Eksin, Satish T. S. Bukkapatnam
This paper introduces an approach based on graph Fourier analysis to automatically identify defective images, as well as crucial graph Fourier coefficients that inform the defects in images amidst highly textured backgrounds.
no code implementations • 17 Apr 2023 • Adithyaa Karthikeyan, Himanshu Balhara, Andreas K Lianos, Abhishek Hanchate, Satish TS Bukkapatnam
Adapting an explainable AI method in LIME (Local Interpretable Model-Agnostic Explanations), certain high-frequency waveform signatures of AE are to be attributed to two major pathways for pore formation in a DED process, namely, spatter events and insufficient fusion between adjacent printing tracks from low heat input.