1 code implementation • 21 Jan 2024 • Shuo Chen, Mao Peng, Yijin Li, Bing-Feng Ju, Hujun Bao, Yuan-Liu Chen, Guofeng Zhang
However, conventional AFM scanning struggles to reconstruct complex 3D micro-/nanostructures precisely due to limitations such as incomplete sample topography capturing and tip-sample convolution artifacts.