Search Results for author: David A. Wickelhaus

Found 1 papers, 0 papers with code

Computer Vision Toolkit for Non-invasive Monitoring of Factory Floor Artifacts

no code implementations12 May 2020 Aditya M. Deshpande, Anil Kumar Telikicherla, Vinay Jakkali, David A. Wickelhaus, Manish Kumar, Sam Anand

This novel toolkit is developed to facilitate easy integration of legacy production machinery and factory floor artifacts with the digital and smart manufacturing environment with no requirement of any physical changes in the machines.

Anomaly Detection Contour Detection +5

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