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Playing Ping Pong with Light: Directional Emission of White Light
In this work, we demonstrate that a specifically designed multi-layer thin film on top of a white LED increases the power of pure white light emitted in forward direction.
Rethinking Fully Convolutional Networks for the Analysis of Photoluminescence Wafer Images
However, generating a chip-fine defect map of the LED wafer, based on photoluminescence images, proves challenging for multiple reasons: on the one hand, the measured brightness values vary from image to image, in addition to local spots of differing brightness.
Fully Convolutional Networks for Chip-wise Defect Detection Employing Photoluminescence Images
Fast photoluminescence measurements, on the other hand, are commonly used to detect wafer separation damages but also hold the potential to enable an efficient detection of all kinds of defective LED chips.
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