Search Results for author: Maximilian Amsler

Found 2 papers, 1 papers with code

Probabilistic Phase Labeling and Lattice Refinement for Autonomous Material Research

1 code implementation15 Aug 2023 Ming-Chiang Chang, Sebastian Ament, Maximilian Amsler, Duncan R. Sutherland, Lan Zhou, John M. Gregoire, Carla P. Gomes, R. Bruce van Dover, Michael O. Thompson

X-ray diffraction (XRD) is an essential technique to determine a material's crystal structure in high-throughput experimentation, and has recently been incorporated in artificially intelligent agents in autonomous scientific discovery processes.

X-Ray Diffraction (XRD)

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