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Found 3 papers, 1 papers with code
Automated crystal orientation mapping by precession electron diffraction assisted four-dimensional scanning transmission electron microscopy (4D-STEM) using a scintillator based CMOS detector
The recent development of electron sensitive and pixelated detectors has attracted the use of four-dimensional scanning transmission electron microscopy (4D-STEM).
Template Matching
Instrumentation and Detectors
Materials Science
Strain-Rate-Dependent Deformation Behavior of Ti29Zr24Nb23Hf24 High Entropy Alloys at Elevated and Room Temperature
Such a softening behavior can be related to the interaction of dislocations with short-range clustering.
Materials Science
Joint non-rigid image registration and reconstruction for quantitative atomic resolution scanning transmission electron microscopy
The bias-correction is responsible for the correction of the slow scan artifacts and based on a explicit coupling of the deformations of the individual images in a series via a minimization of the average deformation.
Applied Physics Image and Video Processing
