Search Results for author: Christos Karapanagiotis

Found 1 papers, 0 papers with code

Fast Fitting of Reflectivity Data of Growing Thin Films Using Neural Networks

no code implementations7 Oct 2019 Alessandro Greco, Vladimir Starostin, Christos Karapanagiotis, Alexander Hinderhofer, Alexander Gerlach, Linus Pithan, Sascha Liehr, Frank Schreiber, Stefan Kowarik

X-ray reflectivity (XRR) is a powerful and popular scattering technique that can give valuable insight into the growth behavior of thin films.

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