Search Results for author: Frank Schreiber

Found 7 papers, 1 papers with code

Neural network analysis of neutron and X-ray reflectivity data: Incorporating prior knowledge for tackling the phase problem

no code implementations28 Jun 2023 Valentin Munteanu, Vladimir Starostin, Alessandro Greco, Linus Pithan, Alexander Gerlach, Alexander Hinderhofer, Stefan Kowarik, Frank Schreiber

Due to the lack of phase information, determining the physical parameters of multilayer thin films from measured neutron and X-ray reflectivity curves is, on a fundamental level, an underdetermined inverse problem.

The onset of molecule-spanning dynamics in a multi-domain protein

no code implementations20 Oct 2021 Benedikt Sohmen, Christian Beck, Tilo Seydel, Ingo Hoffmann, Bianca Hermann, Mark Nüesch, Marco Grimaldo, Frank Schreiber, Steffen Wolf, Felix Roosen-Runge, Thorsten Hugel

Nano- and picosecond dynamics have been assigned to local fluctuations, while slower dynamics have been attributed to larger conformational changes.

Non-equilibrium Roughness Evolution of Small Molecule Mixed Films Reflecting Equilibrium Phase Behavior

no code implementations8 Mar 2021 Alexander Hinderhofer, Jan Hagenlocher, Alexander Gerlach, Joachim Krug, Martin Oettel, Frank Schreiber

Understanding non-equilibrium phenomena, such as growth, and connecting them to equilibrium phase behavior is a major challenge, in particular for complex multicomponent materials.

Applied Physics Computational Physics

Lattice gas study of thin film growth scenarios and transitions between them: Role of substrate

no code implementations5 Oct 2020 Eelco Empting, Miriam Klopotek, Alexander Hinderhofer, Frank Schreiber, Martin Oettel

Thin film growth is investigated in two types of lattice gas models where substrate and film particles are different, expressed by unequal interaction energy parameters.

Soft Condensed Matter

Fast Fitting of Reflectivity Data of Growing Thin Films Using Neural Networks

no code implementations7 Oct 2019 Alessandro Greco, Vladimir Starostin, Christos Karapanagiotis, Alexander Hinderhofer, Alexander Gerlach, Linus Pithan, Sascha Liehr, Frank Schreiber, Stefan Kowarik

X-ray reflectivity (XRR) is a powerful and popular scattering technique that can give valuable insight into the growth behavior of thin films.

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