Search Results for author: Vladimir Starostin

Found 4 papers, 1 papers with code

Neural network analysis of neutron and X-ray reflectivity data: Incorporating prior knowledge for tackling the phase problem

no code implementations28 Jun 2023 Valentin Munteanu, Vladimir Starostin, Alessandro Greco, Linus Pithan, Alexander Gerlach, Alexander Hinderhofer, Stefan Kowarik, Frank Schreiber

Due to the lack of phase information, determining the physical parameters of multilayer thin films from measured neutron and X-ray reflectivity curves is, on a fundamental level, an underdetermined inverse problem.

Fast Fitting of Reflectivity Data of Growing Thin Films Using Neural Networks

no code implementations7 Oct 2019 Alessandro Greco, Vladimir Starostin, Christos Karapanagiotis, Alexander Hinderhofer, Alexander Gerlach, Linus Pithan, Sascha Liehr, Frank Schreiber, Stefan Kowarik

X-ray reflectivity (XRR) is a powerful and popular scattering technique that can give valuable insight into the growth behavior of thin films.

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