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Large Language Models to Generate System-Level Test Programs Targeting Non-functional Properties
System-Level Test (SLT) has been a part of the test flow for integrated circuits for over a decade and still gains importance.
Self-Learning Tuning for Post-Silicon Validation
Increasing complexity of modern chips makes design validation more difficult.
ORSA: Outlier Robust Stacked Aggregation for Best- and Worst-Case Approximations of Ensemble Systems\
In PSV, the task is to approximate the underlying function of the data with multiple learning algorithms, each trained on a device-specific subset, instead of improving the performance of arbitrary classifiers on the entire data set.
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