no code implementations • 30 Sep 2022 • Yiwen Liao, Raphaël Latty, Bin Yang
Post-silicon validation is one of the most critical processes in modern semiconductor manufacturing.
no code implementations • 25 Sep 2022 • Yiwen Liao, Jochen Rivoir, Raphaël Latty, Bin Yang
However, most existing feature selection approaches, especially deep-learning-based, often focus on the features with great importance scores only but neglect those with less importance scores during training as well as the order of important candidate features.
no code implementations • 1 Jul 2022 • Yiwen Liao, Bin Yang, Raphaël Latty, Jochen Rivoir
In this sense, an more efficient tuning requires identifying the most critical tuning knobs and process parameters in terms of a given figure-of-merit for a Device Under Test (DUT).
no code implementations • 1 Jul 2022 • Yiwen Liao, Tianjie Ge, Raphaël Latty, Bin Yang
Intelligent test requires efficient and effective analysis of high-dimensional data in a large scale.
no code implementations • 17 Nov 2021 • Peter Domanski, Dirk Pflüger, Jochen Rivoir, Raphaël Latty
Increasing complexity of modern chips makes design validation more difficult.
no code implementations • 17 Nov 2021 • Peter Domanski, Dirk Pflüger, Jochen Rivoir, Raphaël Latty
In PSV, the task is to approximate the underlying function of the data with multiple learning algorithms, each trained on a device-specific subset, instead of improving the performance of arbitrary classifiers on the entire data set.
no code implementations • 26 Oct 2020 • Yiwen Liao, Raphaël Latty, Bin Yang
Feature selection is generally used as one of the most important preprocessing techniques in machine learning, as it helps to reduce the dimensionality of data and assists researchers and practitioners in understanding data.