Search Results for author: Philippe Leray

Found 8 papers, 0 papers with code

Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance

no code implementations20 Nov 2023 Bappaditya Dey, Anh Tuan Ngo, Sara Sacchi, Victor Blanco, Philippe Leray, Sandip Halder

The goal of this work is of two-fold as, (a) to quantify the impact of overlay on capacitance and (b) to see if we can predict the final capacitance measurements with selected machine learning models at an early stage.

Deep learning denoiser assisted roughness measurements extraction from thin resists with low Signal-to-Noise Ratio(SNR) SEM images: analysis with SMILE

no code implementations23 Oct 2023 Sara Sacchi, Bappaditya Dey, Iacopo Mochi, Sandip Halder, Philippe Leray

The technological advance of High Numerical Aperture Extreme Ultraviolet Lithography (High NA EUVL) has opened the gates to extensive researches on thinner photoresists (below 30nm), necessary for the industrial implementation of High NA EUVL.

Denoising

Deep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach

no code implementations3 Nov 2022 Bappaditya Dey, Enrique Dehaerne, Kasem Khalil, Sandip Halder, Philippe Leray, Magdy A. Bayoumi

In this work, we have revisited and extended our previous deep learning-based defect classification and detection method towards improved defect instance segmentation in SEM images with precise extent of defect as well as generating a mask for each defect category/instance.

Defect Detection Instance Segmentation +3

Relational Constraints for Metric Learning on Relational Data

no code implementations2 Jul 2018 Jiajun Pan, Hoel Le Capitaine, Philippe Leray

Most of metric learning approaches are dedicated to be applied on data described by feature vectors, with some notable exceptions such as times series, trees or graphs.

Metric Learning

Possibilistic Networks: Parameters Learning from Imprecise Data and Evaluation strategy

no code implementations13 Jul 2016 Maroua Haddad, Philippe Leray, Nahla Ben Amor

There has been an ever-increasing interest in multidisciplinary research on representing and reasoning with imperfect data.

Probabilistic Relational Model Benchmark Generation

no code implementations2 Mar 2016 Mouna Ben Ishak, Rajani Chulyadyo, Philippe Leray

The proposed method allows to generate PRMs as well as synthetic relational data from a randomly generated relational schema and a random set of probabilistic dependencies.

Management

A Survey on Latent Tree Models and Applications

no code implementations4 Feb 2014 Raphaël Mourad, Christine Sinoquet, Nevin L. Zhang, Tengfei Liu, Philippe Leray

In data analysis, latent variables play a central role because they help provide powerful insights into a wide variety of phenomena, ranging from biological to human sciences.

Clustering

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