no code implementations • 17 May 2022 • Tianshu Hou, Peining Zhen, Ngai Wong, Quan Chen, Guoyong Shi, Shuqi Wang, Hai-Bao Chen
Electromigration (EM) is one of the major concerns in the reliability analysis of very large scale integration (VLSI) systems due to the continuous technology scaling.
no code implementations • 29 Mar 2022 • Tianshu Hou, Ngai Wong, Quan Chen, Zhigang Ji, Hai-Bao Chen
The electromigration (EM)-induced reliability issues in very large scale integration (VLSI) circuits have attracted increased attention due to the continuous technology scaling.
